Digital Metrology Standards Consortium Supports QIF Standard

The Quality Information Framework (QIF) is a unified XML framework standard for computer-aided quality QIF systems, available free to all implementers.

QIF enables the capture, use, and re-use of metrology-related information throughout the Product Lifecycle Management (PLM) and Product Data Management (PDM) domains.

In August 2020, the DMSC announced the QIF 3.0 metrology standard was harvested, approved, and published by ISO as the new ISO Standard ISO 23952:2020; click to read more on this important status change.

QIF was created by The Digital Metrology Standards Consortium (DMSC TM). DMSC is responsible for the development, maintenance and support of the QIF standard, as well as the Dimensional Measuring Interface Standard (DMIS). The DMSC is an ANSI accredited Standards Developing Organization as well as an A-Liaison to ISO. The DMSC invites participation within the consortium of other standards groups and activities that seek to resolve technological inefficiencies and other issues related to digital metrology.

DMSC Trending Today Interview with Curtis Brown 2019

Latest version: ANSI QIF 3.0 | ISO 23952:2020
The Quality Information Framework (QIF) is a unified XML framework standard for computer-aided quality QIF systems, available free to all implementers.

Member companies and organizations of the DMSC represent innovative, progressive, and advanced organizations, each on the cutting edge of research and technology in the field of dimensional metrology.

Here you will find free tools for using QIF data, a means for submitting QIF enhancement requests or asking general questions, and a wiki with good information about QIF and the QIF Community.

Why QIF?

QIF is a free XML framework standard which defines, organizes, and associates quality information needed in today’s complex cyber-physical manufacturing systems. Digital data must be intelligently organized and passed efficiently throughout the supply chain including: measurement plans, results, part geometry and PMI, measurement templates, resources, statistical analysis, and more.

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